National Instruments is offering a technical seminar on Tuesday 3 November. These FREE, half-day events will feature technical demonstrations and presentations of the latest advances in NI LabVIEW and NI Data Acquisition (DAQ) technology from qualified National Instruments engineers.
Morning Session
09.00?– 12.30?– Data Acquisition with NI LabVIEW Hands-on
Seminar:
Test-drive professional PC-based data acquisition systems and learn how to create modular, flexible and scalable systems with short development times at low cost. NI data acquisition and signal conditioning products ensure highly accurate measurements, and National Instruments LabVIEW gives you the power to easily acquire, analyse and present your data.
Try LabVIEW and NI DAQ products for yourself through a range of guided exercises that:
? Introduce you to the NI LabVIEW graphical programming environment
? Show you how to measure in minutes using the latest USB data acquisition devices
? Teach you how to design LabVIEW control applications
? Find out about the new features in LabVIEW 2009
Afternoon Session
13.30 – 17.00 – Demonstrations of the latest technology available in the NI Academic Site License software bundle
13:30 Session 1
– PC-based measurement and instrumentation
– Deterministic applications with LabVIEW Real-Time and FPGA
– Parallel programming for multicore processors
14:30 Session 2
– Prototype your projects and reduce development time with NI embedded tools
– System level approach to designing mechatronics applications
15:15 Break
15:30 Session 3
– Effective signal processing, analysis and mathematical techniques
– Software-defined communication systems with RF
16:15 Session 4
– Circuit and Electronic Design with Multisim, Ultiboard and LabVIEW
– Green Engineering and the Environment: Measure it and fix it
17:00 Finish
Location and date:
Building 34, Room 3019
Tuesday 3 November 2009
How do I register?
Places are limited, so please call Angie Cribb on 01635 572424 or email angie.cribb@ni.com
Please specify which session you wish to attend.