Ìì·¢ÓéÀÖÆåÅÆ_Ìì·¢ÓéÀÖAPP-¹ÙÍø|ÏÂÔØ X-Ray Diffractometer is a General Area Detector Diffraction System (GADDS-C2) which is manufactured by Bruker. The XRD system can be set up for a one off measurement of a bulk or thin film sample, or can be configured to high throughput specifications to allow the automated analysis of up to 100 measurements on a single sample.