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Advanced Composite Materials Facility

Scanning Electron Microscope with Energy Dispersive X-Ray attachment

天发娱乐棋牌_天发娱乐APP-官网|下载 Scanning Electron Microscope is a JSM59 SEM manufactured by JEOL with the INCA software package form Oxford Instruments to control the Energy Dispersive X-Ray (EDX) analysis.

JSM59 Scanning Electron Microscope
JSM59 Scanning Electron Microscope
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