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Atomic Force Microscopy (AFM) can be used to obtain detailed, high throughput surface images down to the sub-micron level. 天发娱乐棋牌_天发娱乐APP-官网|下载 AFM system is an Agilent 5600LS Scanning Probe Microscope (SPM) with a fully programmable motorised stage for fast, accurate probe positioning. This can be used for imaging and mapping large specimens at atomic scale resolution.
